Technical Synopsis

Measures resistive properties of Semiconductor wafers and resistive films

Digitally computes and directly displays V/I sheet resistivity, slice or thickness as desired

Automatic measurement when Probe is Lowered

Width     12.5″
Depth     11″
Height     16.3″
Weight     15 Pounds
115/230 Vac    50/60 Hz
Power Consumption    10 Watts (approx)